The scanCONTROL sensors record a profile from individual calibrated points for each measurement. These profiles can be used individually or combined in a container set, and transferred to your own applications as an array or matrix. In addition to the data transfer of individual measuring points and their additional information (e.g. intensity, counter reading) the entire configuration of the sensor can also be controlled from its own application software.
The data transfer and the configuration of the sensors can be realized in different ways:
The C/C++ library for scanCONTROL supports both static and dynamic loading. Both stdcall and cdecl are supported as calling conventions. The individual functions of the library are clearly documented in the interface description and explained using examples.
The scanCONTROL SDK integration package includes:
LLT.DLL library file
Documentation for interfaces and scanCONTROL
Interface for C#
Numerous programming examples for C++ and C# (e.g. trigger and container mode)
DeveloperDemo.exe demo for quick testing of the sensor configuration
The scanCONTROL instrument driver LabVIEW supports fast integration of scanCONTROL sensors into National Instruments LabVIEW. For accessing a scanCONTROL sensor and its basic settings, users can drag-and-drop modules directly from the function palette into their VIs. Example VIs illustrating the scanCONTROL integration are also part of this package.
The integration of scanCONTROL sensors into the LabVIEW environment is based on the C/C++ library (LLT.DLL) of Micro-Epsilon. Detailed documentation also shows how to set up additional special sensor parameters.
The scanCONTROL instrument driver for LabVIEW:
Developed according to the LabVIEW instrument driver guidelines by National Instruments
LabVIEW 8.6 and higher supported
Comprises instrument drivers for 32Bit and 64Bit
Fast and easy access to all settings via function palette
Ethernet interface supported
Example VIs for single profile mode and container mode