Inspection of cracks and breakages

Confocal chromatic sensors from Micro-Epsilon are used to detect cracks and other defects on the wafer. They reliably detect surfaces with varying reflection characteristics due to a fast surface compensation feature. An extremely small light spot and high resolution enable the reliable detection of the finest of anomalies on the wafer.

Micro-Epsilon Messtechnik
Königbacher Str. 15
94496 Ortenburg
info@micro-epsilon.de
+49 8542 / 168 - 0
+49 8542 / 168 - 90